350 Leonhard, Department of Industrial and Manufacturing Engineering 
Penn State University, University Park PA 16802

 
 1. A General Approach to Confidence Regions for Optimal Factor Levels of
 Response Surfaces
 John J. Peterson, Suntara Cahya, and Enrique del Castillo
 Abstract, Complete paper
 
 2. Computation and Visualization of Confidence Regions for Optimal Factor Levels
 in Constrained Response Surface Problems
 Suntara Cahya, Enrique del Castillo and John J. Peterson 
 Abstract, Complete paper
 
 3. A Tool for Computing Confidence Regions on the Stationary Point of a Response
 Surface
 Enrique del Castillo and Suntara Cahya
 Abstract, Complete paper
 4. Stochastic Approximation and Stochastic Gradient methods–a overview and 
 guide to the literature
 Enrique del Castillo 
 Abstract, Complete paper
 
 5. Identification and Fine Tuning of Closed-loop Processed under Discrete EWMA
 and PI Adjustments
 Rong Pan and Enrique del Castillo
 Abstract, Complete paper
 
 6. An Unifying View of Some Process Adjustment Methods
 Enrique del Castillo, Rong Pan and Bianca M. Colosimo
 Abstract, Complete paper
 
 7. Small Sample Performance of Some Statistical Setup Adjustment Methods
 Enrique del Castillo, Rong Pan and Bianca M. Colosimo
 Abstract, Complete paper
 
 8. Integration of Sequential Process Adjustment and Process Monitoring
 Techniques
 Rong Pan and Enrique del Castillo
 Abstract, Complete paper
 
 9. On-line Process Adjustment for Asymmetric Cost Functions
 B.M. Colosimo, R. Pan and E. del Castillo
 Abstract, Complete paper
 
 10. An Enhanced Recursive Stopping Rule for Steepest Ascent Searches
 in Response Surface Methodology
 Guillermo Miró and Enrique del Castillo
 Abstract, Complete paper
 
 11. A Multivariate Double EWMA Process Adjustment Scheme for Drifting Processes
 Enrique del Castillo and Ramkumar Rajagopal 
 Abstract, Complete paper
 
 12. A Bayesian Approach for Multiple Response Surface Optimization in the Presence 
 of Noise Variables
 Guillermo Miró, Enrique del Castillo and John J. Peterson
 Abstract, Complete paper
 
 13. A Dual response Approach to the Multivariate Robust Parameter Design Problem
 Guillermo Miró, and Enrique del Castillo
 Abstract, Complete paper
 
 14. A Sequential Markov Chain Monte Carlo Approach to Setup Adjustment
 of a Process Over a Set of Lots
 B.M. Colosimo, R. Pan and E. del Castillo
 Abstract, Complete paper
 
 15. Scheduling Methods for the Statistical Setup Adjustment Problem
 R. Pan and E. del Castillo
 Abstract, Complete paper, Correction to the paper
 
 16. Considering the Prediction Variance in the Dual Response Approach to Robust
 Parameter Design
 Guillermo Miró-Quesada and Enrique del Castillo
 Abstract, Complete paper 
 
 17. A Bivariate dead Band Adjustment Policy
 Enrique del Castillo and Rainer Göb
 Abstract, Complete paper 
 
 18. An Analysis and MIMO Extension of a Double EWMA Run-to-Run Controller for
 Non-squared systems
 Ramkumar Rajagopal and Enrique del Castillo
 Abstract, Complete paper
 
 19. Model-Robust Process Optimization using Bayesian Model Averaging
 Ramkumar Rajagopal and Enrique del Castillo
 Abstract, Complete paper
 
 20. Setup Adjustment Under Unknown Process Parameters and Fixed Adjustment Cost
 Zilong Lian and Enrique del Castillo
 Abstract, Complete paper
 
 21. A Bayesian Method for Robust Tolerance Control and Parameter Design
 Ramkumar Rajagopal and Enrique del Castillo
 Abstract, Complete paper
 
 22. Model-Robust Process Optimization with Noise Factors and Non-normal Error Terms
 Ramkumar Rajagopal, Enrique del Castillo and John J. Peterson
 Abstract, Complete paper
 
 23. A Bayesian Approach for Multiple Criteria Decision Making with 
 application in "Design for Six Sigma"
 Ramkumar Rajagopal and Enrique del Castillo
 Abstract, Complete paper
 
 24. Setup Error Adjustment: Sensitivity Analysis and a new MCMC Control Rule
 Zilong Lian, Bianca M. Colosimo and Enrique del Castillo 
 Abstract, Complete Paper
 
 25. Statistical Process Adjustment: a brief retrospective, current status, 
 and some opportunities for further work
 Enrique del Castillo  
 Abstract, Complete Paper
 
 26. Closed-Loop System Identification for Small Samples with Constraints
 O. Arda Vanli and Enrique del Castillo  
 Abstract, Complete Paper
 

27. Model Context Selection for Run-to-Run Control

O. Arda Vanli, Nital S. Patel, Mani Janakiram and Enrique Del Castillo

 Abstract, Complete Paper
 
 28. Statistical Change-point Methods for Closed-loop Delay Estimation
 O. Arda Vanli, Enrique Del Castillo and Bianca M. Colosimo
 Abstract, Complete Paper
 
  29. Bayesian Approaches for On-line Robust Parameter Design 
  O. Arda Vanli and Enrique Del Castillo
 Abstract, Complete Paper